Park NX12 can be used for any project,The numerous scanning modes and modular design of the NX series make it easy to adapt to the needs of any scanning probe microscope.

Standard imaging:

• True non-contact mode AFM
• Contact Mode AFM
• Lateral Force Microscopy (LFM)
• phase imaging
• Tap type AAFM

Electrical performance:

• Conductive AFM
• I-V spectral lines
• Scanning Kelvin Probe Microscope (SKPM/KPM)
• High voltage SKPM
• Scanning capacitance microscope (SCM)
• Scanning Resistance Microscopy (SSRM)
• Scanning tunneling microscope (STM)
• Scanning Tunnel Spectroscopy (STS)
• Time resolved photocurrent mapping (Tr PCM)

Magnetic properties:

• Magnetic force microscope (MFM)
• Adjustable external magnetic field MFM

Chemical properties:

• Scanning electrochemical cell microscope (SECCM)
• Scanning Electrochemical Microscopy (SECM)
• Electrochemical microscopes (EC-STM and EC-AFM)
• Chemical force microscope with functionalized probes

Thermal performance:

• Scanning Thermal Microscopy (SThM)

Optical performance:

• Probe enhanced Raman spectroscopy (TERS)
• Time resolved photocurrent mapping (Tr PCM)

Dielectric/piezoelectric properties:

• Electrostatic force microscope (EFM)
• Dynamic contact electrostatic force microscope (DC-EFM)
• Piezoelectric force microscope (PFM)
• High voltage PFM

Mechanical properties

• Pinpoint Nanomechanical Mapping
• Force Modulation Microscopy (FMM)
• nanoindentation
• Nanolithography
• High voltage nanoetching
• nanomanipulation
• Piezoelectric force microscope (PFM)

Force measurement:

• Force Distance (F-D) Spectroscopy
• Force volume imaging
• Calibration of elasticity coefficient using thermal noise method

atomic force microscope atomic force microscope